[PDF.96pu] ISO 16700:2004, Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
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ISO 16700:2004, Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
[PDF.zo70] ISO 16700:2004, Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2004, Microbeam analysis ISO/TC 202/SC 4 epub ISO 16700:2004, Microbeam analysis ISO/TC 202/SC 4 pdf download ISO 16700:2004, Microbeam analysis ISO/TC 202/SC 4 pdf file ISO 16700:2004, Microbeam analysis ISO/TC 202/SC 4 audiobook ISO 16700:2004, Microbeam analysis ISO/TC 202/SC 4 book review ISO 16700:2004, Microbeam analysis ISO/TC 202/SC 4 summary
| #9167342 in Books | 2007-08-23 | 10.50 x.6 x8.25l, | File type: PDF | 24 pages|
ISO 16700:2004 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.
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